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Volumn 40, Issue 4, 1997, Pages 29-33

Considerations regarding the Statistics of Particle Counting

Author keywords

FED STD 209E; ISO TC 209; Particle counting; Standards; Statistical quality control; Statistics; Ultraclean environments

Indexed keywords

IMPURITIES; SEMICONDUCTOR DEVICE MANUFACTURE; STATISTICAL METHODS; CONTAMINATION; PARTICLES (PARTICULATE MATTER); QUALITY CONTROL; STANDARDS; STATISTICAL PROCESS CONTROL;

EID: 0031176011     PISSN: 10984321     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (10)
  • 2
    • 0022718192 scopus 로고
    • Statistical Management and Analysis of Particle Count Data in Ultraclean Environments: Part 1
    • Bzik, T.J., Statistical Management and Analysis of Particle Count Data in Ultraclean Environments: Part 1, Microcontamination, V. 4, No. 5 (1986).
    • (1986) Microcontamination , vol.4 , Issue.5
    • Bzik, T.J.1
  • 3
    • 0024738657 scopus 로고
    • Status and Needs of In-Situ Real-Time Process Particle Detection
    • Bowling, R.A., Larrabee, G.B., Fisher, W.G., "Status and Needs of In-Situ Real-Time Process Particle Detection," Journal of the IES, V. 32, No. 5, pp. 22-27 (1989).
    • (1989) Journal of the IES , vol.32 , Issue.5 , pp. 22-27
    • Bowling, R.A.1    Larrabee, G.B.2    Fisher, W.G.3
  • 4
    • 0347165632 scopus 로고
    • Model Study of Contaminant Flow in the Vicinity of Semiconductor Processing Equipment
    • Yamamoto, T., Viner, A.S., Donovan, R.P., Ensor, D.S., "Model Study of Contaminant Flow in the Vicinity of Semiconductor Processing Equipment," Journal of the IES, V. 33, No. 4, pp. 25-31 (1990).
    • (1990) Journal of the IES , vol.33 , Issue.4 , pp. 25-31
    • Yamamoto, T.1    Viner, A.S.2    Donovan, R.P.3    Ensor, D.S.4
  • 7
    • 0024070535 scopus 로고
    • Statistical Analysis Relating to Recent Federal Standard 209 (Cleanrooms) Revisions
    • Cooper, D.W., Statistical Analysis Relating to Recent Federal Standard 209 (Cleanrooms) Revisions, Journal of the IES, V. 31, No. 5, pp. 48-52 (1988).
    • (1988) Journal of the IES , vol.31 , Issue.5 , pp. 48-52
    • Cooper, D.W.1
  • 8
    • 0347165636 scopus 로고    scopus 로고
    • Assessing the Role of Statistics in Next-generation Standards
    • Bzik, T.J., "Assessing the Role of Statistics in Next-generation Standards," Microcontamination, V. 14, No. 9 (1996).
    • (1996) Microcontamination , vol.14 , Issue.9
    • Bzik, T.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.