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Volumn 40, Issue 4, 1997, Pages 29-33
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Considerations regarding the Statistics of Particle Counting
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Author keywords
FED STD 209E; ISO TC 209; Particle counting; Standards; Statistical quality control; Statistics; Ultraclean environments
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Indexed keywords
IMPURITIES;
SEMICONDUCTOR DEVICE MANUFACTURE;
STATISTICAL METHODS;
CONTAMINATION;
PARTICLES (PARTICULATE MATTER);
QUALITY CONTROL;
STANDARDS;
STATISTICAL PROCESS CONTROL;
PARTICLE COUNTING;
STATISTICAL QUALITY CONTROL;
PARTICLES (PARTICULATE MATTER);
POLLUTION CONTROL;
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EID: 0031176011
PISSN: 10984321
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (10)
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