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Volumn 52, Issue 4, 1997, Pages 241-246

Eine berührungslose und zerstörungsfreie methode zur bestimmung der härteprofile beim laserhärten

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; HARDENING; LASER APPLICATIONS; NONDESTRUCTIVE EXAMINATION; NUMERICAL METHODS; PHOTOMETRY; RADIOMETRY; STEEL; THERMAL CONDUCTIVITY;

EID: 0031175661     PISSN: 0341101X     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (15)
  • 1
    • 0026850141 scopus 로고
    • An overview of the ultrasonic detection of creep damage
    • Stamm, H.: An overview of the ultrasonic detection of creep damage. European Journal of Non Destructive Testing 1 (1992) S. 169-178.
    • (1992) European Journal of Non Destructive Testing , vol.1 , pp. 169-178
    • Stamm, H.1
  • 2
    • 0346162081 scopus 로고
    • Electromagnetic multiparameter determination of material characteristics
    • Grotz, K.; Lutz, B.: Electromagnetic multiparameter determination of material characteristics. Materials Evaluation 49 (1991) 1, S. 40-43.
    • (1991) Materials Evaluation , vol.49 , Issue.1 , pp. 40-43
    • Grotz, K.1    Lutz, B.2
  • 3
    • 0000073730 scopus 로고
    • Evaluation of case depth on steels by Barkhausen noise measurement
    • Dubois, M., Fiset, M.: Evaluation of case depth on steels by Barkhausen noise measurement. Mater. Sci. Technol. 11 (1995) 3, S. 264-267.
    • (1995) Mater. Sci. Technol. , vol.11 , Issue.3 , pp. 264-267
    • Dubois, M.1    Fiset, M.2
  • 4
    • 0000340606 scopus 로고
    • Photothermal nondestructive evaluation of materials with thermal waves
    • edited by A. Mandelis, Elsevier, New York
    • Busse, G., Walther, H. G.: Photothermal nondestructive evaluation of materials with thermal waves. In: Principles & Perspectives of Photothermal and Photoacoustic Phenomena, edited by A. Mandelis, Elsevier, New York, 1992, Vol. 1, S. 205-298.
    • (1992) Principles & Perspectives of Photothermal and Photoacoustic Phenomena , vol.1 , pp. 205-298
    • Busse, G.1    Walther, H.G.2
  • 5
    • 0000000774 scopus 로고
    • Photoacoustic frequencydomain depth profilometry of surface-layer inhomogeneities: Application to laser processed steels
    • Ma, T. C.; Munidasa, M.; Mandelis, A.: Photoacoustic frequencydomain depth profilometry of surface-layer inhomogeneities: Application to laser processed steels. J. Appl. Phys. 71 (1992) S. 6029-6035.
    • (1992) J. Appl. Phys. , vol.71 , pp. 6029-6035
    • Ma, T.C.1    Munidasa, M.2    Mandelis, A.3
  • 6
    • 0026974988 scopus 로고
    • Non-destructive depth-profiling of laser processed Zr-2.5 NB alloy by IR photothermal radiometry
    • Munidasa, M.; Chi, M. T.; Mandelis, A.; Brown, S. K.; Mannik, L.: Non-destructive depth-profiling of laser processed Zr-2.5 NB alloy by IR photothermal radiometry. Materials Science and Engineering A 759 (1992) S. 111-118.
    • (1992) Materials Science and Engineering A , vol.759 , pp. 111-118
    • Munidasa, M.1    Chi, M.T.2    Mandelis, A.3    Brown, S.K.4    Mannik, L.5
  • 7
    • 0000178712 scopus 로고
    • The thermal conductivity of insolators and semiconductors
    • Vandersande, J. W.; Wood, C.: The thermal conductivity of insolators and semiconductors. Contemp. Phys. 27 (1986) S. 117-144.
    • (1986) Contemp. Phys. , vol.27 , pp. 117-144
    • Vandersande, J.W.1    Wood, C.2
  • 8
    • 0015962001 scopus 로고
    • Thermal conductivity of copper films
    • Nath, P.; Chopra, K. L.: Thermal conductivity of copper films. Thin Solid Films 20 (1974) S. 53-61.
    • (1974) Thin Solid Films , vol.20 , pp. 53-61
    • Nath, P.1    Chopra, K.L.2
  • 9
    • 3943050603 scopus 로고
    • Thermal conductivity of ultrathin metal films in multilayer structure
    • Chopra, K. L.; Nath, P.: Thermal conductivity of ultrathin metal films in multilayer structure. J. App. Phys. 45 (1973) S. 1923-1925.
    • (1973) J. App. Phys. , vol.45 , pp. 1923-1925
    • Chopra, K.L.1    Nath, P.2
  • 10
    • 3943064219 scopus 로고
    • Size effects on the thermal conductivity in thin aluminium films
    • Stops, D. W.: Size effects on the thermal conductivity in thin aluminium films. Thin Solid Films 67 (1980) L. 43.
    • (1980) Thin Solid Films , vol.67 , pp. 43
    • Stops, D.W.1
  • 11
    • 0010419466 scopus 로고
    • Grain size dependence of the thermal conductivity of polycrystalline chemical vapor deposited a-SiC at low temperatures
    • Collins, A. K.; Pickering, M. A.; Taylor, R. L.: Grain size dependence of the thermal conductivity of polycrystalline chemical vapor deposited a-SiC at low temperatures. J. Appl. Phys. 68 (1990) S. 6510-6512.
    • (1990) J. Appl. Phys. , vol.68 , pp. 6510-6512
    • Collins, A.K.1    Pickering, M.A.2    Taylor, R.L.3
  • 12
    • 0000567074 scopus 로고
    • Unusually high thermal conductivity of diamond films
    • Graebner, J. E.; Jin, S.; Kammplott, G. W.: Unusually high thermal conductivity of diamond films. Appl. Phys. Lett. 60 (1992) S. 1576-1578.
    • (1992) Appl. Phys. Lett. , vol.60 , pp. 1576-1578
    • Graebner, J.E.1    Jin, S.2    Kammplott, G.W.3
  • 13
    • 0000106178 scopus 로고
    • Experimental results of photothermal microstructural depth profiling
    • Lan, T. T. N.; Seidel, U.; Walther, H. G.; Goch, G.; Schmitz, B.: Experimental results of photothermal microstructural depth profiling. J. Appl. Phys. 78 (1995) S. 4108-4111.
    • (1995) J. Appl. Phys. , vol.78 , pp. 4108-4111
    • Lan, T.T.N.1    Seidel, U.2    Walther, H.G.3    Goch, G.4    Schmitz, B.5
  • 14
    • 0029304874 scopus 로고
    • Theory of microstructural depth profiling by photothermal measurements
    • Lan, T. T. N.; Seidel, U.; Walther, H. G.: Theory of microstructural depth profiling by photothermal measurements. J. Appl. Phys. 77 (1995), S. 4739-4745.
    • (1995) J. Appl. Phys. , vol.77 , pp. 4739-4745
    • Lan, T.T.N.1    Seidel, U.2    Walther, H.G.3
  • 15
    • 0013376051 scopus 로고    scopus 로고
    • Photothermal depth profiling using only phase data
    • Lan, T. T. N.; Walther, H. G.: Photothermal depth profiling using only phase data. J. Appl. Phys. 80 (1996) S. 5289-5291.
    • (1996) J. Appl. Phys. , vol.80 , pp. 5289-5291
    • Lan, T.T.N.1    Walther, H.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.