Simultaneous determination of elastic constants and crystallographic orientation in coarse-grained nickel by acoustic spectro-microscopy

Materials Transactions, JIM

Volumn 38, Issue 6, 1997, Pages 536-545

  Xu, Yang ^a   Aizawa, Tatsuhiko ^a   Kihara, Junji ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Acoustic spectro microscopy; Crystallographic orientation; Cubic material; Elastic constant; Inverse analysis; Nickel; Powell least square fitting method; Pseudo surface wave; Rayleigh critical angle; Rayleigh surface wave

Indexed keywords

ACOUSTIC SPECTROSCOPY; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELASTICITY; INVERSE PROBLEMS; LEAST SQUARES APPROXIMATIONS; SENSITIVITY ANALYSIS; STIFFNESS;

ACOUSTIC SPECTRO MICROSCOPY; COARSE GRAINED NICKEL; CRYSTALLOGRAPHIC ORIENTATION; ELASTIC CONSTANTS; INVERSE ANALYSIS; POWELL LEAST SQUARE FITTING METHOD; RAYLEIGH SURFACE WAVE;

NICKEL;

EID: 0031170646     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.38.536     Document Type: Article

References (34)

1. H. J. Mcskimin: J. Appl. Phys., 24 (1953), 988.
2. H. J. Mcskimin: J. Appl. Phys., 26 (1955), 406.
3. S. Eros and J. R. Reitz: J. Appl. Phys., 29 (1958), 683.
4. R. E. Green, Jr. and E. G. Henneke: J. Acoust. Soc. Am., 41 (1967), 84.
5. D. Y. Chung and V. Konecny: Phys. Stat. Sol., (a)52 (1979), 29.
6. Z. Li and E. S. Fisher: J. Mater. Sci. Lett., 9 (1990), 759.
7. L. T. Wang: J. Phys: Condens. Matter, 7 (1995), 3863.
8. A. G. Every and W. Sachse: Phys. Rev., B42 (1990), 8196.
9. K. Y. Kim, W. Sachse and A. G. Every: J. Acoust. Soc. Am., 93 (1993), 1393.
10. J.-F. Chai and T.-T. Wu: J. Acoust. Soc. Am., 95 (1994), 3232.
11. G. B. Benedek and K. Fritsch: Phys. Rev., 149 (1966), 647.
12. M. W. Elmiger, J. Henz, H. von Känel, M. Ospelt and P. Wachter: Surf. Interf. Anal., 14 (1989), 18.
13. S. Sathish, M. Mendik, A. Kulik, G. Gremaud and P. Wachter: Appl. Phys. Lett., 59 (1991), 167.
14. M. Mendik, S. Sathish, A. Kulik, G. Gremaud and P. Wachter: J. Appl. Phys., 71 (1992), 2830.
15. U. Schärer and P. Wachter: Solid State Commun., 96 (1995), 497.
16. C. Proust, Y. Vaills, Y. Luspin and E. Husson: Solid State Commun., 93 (1995), 729.
17. J. O. Kim, J. D. Achenbach, P. B. Mirkarimi, M. Shinn and S. A. Barnett: J. Appl. Phys., 72 (1992), 1805.
18. Y. C. Lee, J. O. Kim and J. D. Achenbach: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 42 (1995), 253.
19. K. U. Würz, J. Wesner, K. Hillmann and W. Grill: Z. Phys., B97 (1995), 487.
20. S. Sathish, M. Mendik, J. H. Cantrell and W. T. Yost: J. Acoust. Soc. Am., 98 (1995), 2854.
21. A. Migliori, J. L. Sarrao, W. M. Visscher, T. M. Bell, M. Lei, Z. Fisk and R. G. Leisure: Physica, B183 (1993), 1.
22. J. L. Sarrao, S. R. Chen, W. M. Visscher, M. Lei, U. F. Kocks and A. Migliori: Rev. Sci. Instrum., 65 (1994), 2139.
23. F. Chu, M. Lei, S. A. Maloy, T. E. Mitchell, A. Migliori and J. Garrett: Philosophical Magazine, B71 (1995), 373.
24. O. I. Diachok, R. J. Hallermeier and W. G. Mayer: Appl. Phys. Lett., 17 (1970), 288.
25. J. O. Kim and J. D. Achenbach: Thin Solid Films, 214 (1992), 25.
26. Y. Xu, T. Aizawa and J. Kihara: Mater. Trans., JIM, 37 (1996), 1690.
27. G. W. Farnell: Physical Acoustics, VI, Ed. by W. P. Mason and R. N. Thurston, Academic Press, New York, (1970), p. 109.
28. M. J. D. Powell: The Computer Journal, 7 (1965), 303.
29. W. F. Hosford: The Mechanics of Crystals and Textured Polycrystals, Ed. by A. L. Cullen and L. C. Woods, Oxford University Press, New York, (1993), p. 16.
30. R. G. Pratt and T. C. Lim: Appl. Phys. Letters., 15 (1969), 403.
31. J. Kushibiki, K. Horii and N. Chubachi: Electronics Letters, 18 (1982), 732.
32. J. O. Kim, J. D. Achenbach, P. B. Mirkarimi, M. Shinn and S. A. Barnett: J. Appl. Phys., 72 (1992), 1805.
33. J. O. Kim and R. D. Weglein: J. Appl. Phys., 75 (1994), 5459.
34. J. Huang and J. D. Achenbach: Res. Nondestr. Eval., 5 (1994), 225.