Scanning tunneling microscopy investigations of single-q charge density wave state in hafnium-doped tantalum disulfide

Surface Science

Volumn 381, Issue 2-3, 1997, Pages

  Bando, H ^a   Miyahara, Y ^a   Enomoto, H ^b   Ozaki, H ^a  

^a WASEDA UNIVERSITY   (Japan)

^b OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

Author keywords

Chalcogens; Hafnium; Scanning tunneling microscopy; Sulphides; Tantalum

Indexed keywords

ATOMS; ELECTRONIC STRUCTURE; HAFNIUM; SCANNING TUNNELING MICROSCOPY; TANTALUM COMPOUNDS;

CHARGE DENSITY WAVE; TANTALUM DISULFIDE;

SURFACE STRUCTURE;

EID: 0031170270     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00082-4     Document Type: Article

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