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Volumn 7, Issue 6, 1997, Pages 1227-1243

Radiation effects in thin-film ferroelectric PZT for non-volatile memory applications in microelectronics

Author keywords

[No Author keywords available]

Indexed keywords

FATIGUE OF MATERIALS; HYSTERESIS; IONIZATION; MICROELECTRONIC PROCESSING; RADIATION EFFECTS; SEMICONDUCTING LEAD COMPOUNDS; THIN FILMS;

EID: 0031170078     PISSN: 11554320     EISSN: None     Source Type: Journal    
DOI: 10.1051/jp3:1997185     Document Type: Article
Times cited : (24)

References (29)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.