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Volumn 52, Issue 7, 1997, Pages 915-921

Fundamental quantification procedure for total reflection X-ray fluorescence spectra analysis and elements determination

Author keywords

Total reflection X ray fluorescence; X ray spectra fitting

Indexed keywords

CHEMICAL ELEMENTS; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; X RAY SPECTROMETERS;

EID: 0031169821     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0584-8547(96)01602-3     Document Type: Article
Times cited : (4)

References (17)
  • 1
    • 0042718152 scopus 로고
    • Total reflection XRF
    • R.E. Van Grieken and A.A. Markowicz (eds.), Dekker, New York
    • H. Schwenke and J. Knoth, Total reflection XRF. In: R.E. Van Grieken and A.A. Markowicz (eds.), Handbook of X-Ray Spectrometry - Methods and Techniques, Vol. 14, Dekker, New York 1993, p. 453.
    • (1993) Handbook of X-Ray Spectrometry - Methods and Techniques , vol.14 , pp. 453
    • Schwenke, H.1    Knoth, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.