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Volumn 52, Issue 7, 1997, Pages 915-921
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Fundamental quantification procedure for total reflection X-ray fluorescence spectra analysis and elements determination
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Author keywords
Total reflection X ray fluorescence; X ray spectra fitting
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Indexed keywords
CHEMICAL ELEMENTS;
ELECTROMAGNETIC WAVE REFLECTION;
FLUORESCENCE;
X RAY SPECTROMETERS;
TOTAL REFLECTION X RAY FLUORESCENCE SPECTRA ANALYSIS;
X RAY ANALYSIS;
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EID: 0031169821
PISSN: 05848547
EISSN: None
Source Type: Journal
DOI: 10.1016/s0584-8547(96)01602-3 Document Type: Article |
Times cited : (4)
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References (17)
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