Spike voltages seen during "quick charge" ramp limitation tests on Nb3Sn cable-in-conduit conductors

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 1, 1997, Pages 150-154

  Takayasu, M ^a   Vysotsky, V S ^a   Jeong, S ^a   Michael, P C ^a   Schultz, J H ^a   Minervini, J V ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; HIGH TEMPERATURE EFFECTS; INDUCED CURRENTS; MATHEMATICAL MODELS; NIOBIUM ALLOYS; QUENCHING; TRANSIENTS;

CABLE IN CONDUIT CONDUCTORS (CICC); SPIKE VOLTAGES;

SUPERCONDUCTING CABLES;

EID: 0031169574     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.614444     Document Type: Article

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