Measurement and modelling of sensitivity and noise of MOS magnetic field-effect transistors

Sensors and Actuators, A: Physical

Volumn 61, Issue 1-3, 1997, Pages 346-351

  Killat, Dirk ^a   Kluge, Johannes V ^a   Umbach, Frank ^a   Langheinrich, Werner ^a   Schmitz, Richard ^b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b DIALOG SEMICONDUCTOR   (Germany)

Author keywords

MAGFETs; Modelling; MOSFETs

Indexed keywords

ELECTRIC RESISTANCE; SEMICONDUCTOR DEVICE MODELS;

MAGNETIC FIELD SENSITIVE SPLIT DRAIN MOSFET (MAGFET); SPECTRAL NOISE DENSITY MEASUREMENT;

MOSFET DEVICES;

EID: 0031169538     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(97)80286-5     Document Type: Article

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