Ion beam effects in polymer films: Structure evolution of the implanted layer

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 129, Issue 1, 1997, Pages 60-64

  Popok, V N ^a   Odzhaev, V B ^a   Kozlov, I P ^a   Azarko, I I ^a   Karpovich, I A ^a   Sviridov, D V ^a  

^a BELARUSIAN STATE UNIVERSITY   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTERIZATION; NEUTRON DEPTH PROFILING;

CELLULOSE; ION BEAMS; ION IMPLANTATION; OXIDATION; PHYSICAL PROPERTIES; POLYAMIDES; POLYETHYLENES; RADIATION DAMAGE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTROSCOPY; STRUCTURE (COMPOSITION); THIN FILMS;

RADIATION EFFECTS;

EID: 0031169126     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00208-5     Document Type: Article

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