Flux jump stability in Nb3Sn tape

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 2, 1997, Pages 1524-1528

  King, Christopher G ^a   Grey, Delton A ^a   Mantone, Anthony ^a   Xu, Bu Xin ^a   Murray, Melissa L ^b   Hart Jr , Howard R ^b   Benz, Mark G ^b  

^a GE Medical Systems   (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); GLASS; LOW TEMPERATURE EFFECTS; LOW TEMPERATURE OPERATIONS; NIOBIUM ALLOYS; SOLENOIDS;

FLUX JUMP STABILITY; SLITTING EDGE DAMAGE; SUPERCONDUCTING TAPES;

SUPERCONDUCTING WIRE;

EID: 0031168501     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.620863     Document Type: Article

References (14)

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