Residual surface resistance of YBa2Cu3Ox thin films - Weakly coupled grain model

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 2, 1997, Pages 1253-1256

  Yoshida, K ^a   Nagasawa, K ^a   Shimakage, H ^b   Wang, Z ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b ADVANCED TELECOMMUNICATIONS RESEARCH INSTITUTE INTERNATIONAL   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC RESISTANCE MEASUREMENT; GRAIN SIZE AND SHAPE; HIGH TEMPERATURE SUPERCONDUCTORS; JOSEPHSON JUNCTION DEVICES; MATHEMATICAL MODELS; OXIDE SUPERCONDUCTORS; POLYCRYSTALLINE MATERIALS; RESONATORS; WAVEGUIDES;

COPLANAR WAVEGUIDE RESONATOR TECHNIQUE; MAGNETIC PENETRATION DEPTH; RESIDUAL SURFACE RESISTANCE; WEAKLY COUPLED GRAIN MODEL;

SUPERCONDUCTING FILMS;

EID: 0031167985     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.620741     Document Type: Article

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