Symbolic Handling of Bridging Fault Effects

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 10, Issue 3, 1997, Pages 271-276

  Favalli, Michele ^a   Dalpasso, Marcello ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b UNIVERSITY OF FERRARA   (Italy)

Author keywords

Binary decision diagrams (BDDs); Bridging faults; Fault simulation

Indexed keywords

BINARY SEQUENCES; BOOLEAN FUNCTIONS; BRIDGE CIRCUITS; COMPUTER SIMULATION; DECISION TABLES; ELECTRONIC EQUIPMENT TESTING; FAILURE ANALYSIS; GATES (TRANSISTOR);

BINARY DECISION DIAGRAMS (BDD); BRIDGING FAULT EFFECTS;

CMOS INTEGRATED CIRCUITS;

EID: 0031167822     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008223826585     Document Type: Article

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