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Volumn 36, Issue 6 A, 1997, Pages 3396-3407

Numerical simulation of plasma chemical vapor deposition from silane: Effects of the plasma-substrate distance and hydrogen dilution

Author keywords

Hydrogen dilution; Hydrogenated amorphous silicon; Numerical simulation; Plasma substrate separation; Rf plasma chemical vapor deposition

Indexed keywords

DILUTION; GAS PHASE POLYMERIZATION; HYDROGENATED AMORPHOUS SILICON; PLASMA CHEMICAL VAPOR DEPOSITION;

EID: 0031167536     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.3396     Document Type: Article
Times cited : (10)

References (45)
  • 21
    • 3643141523 scopus 로고
    • Proc. 7th Int. Symp. Plasma Chem., Eindhoven, 1985 (Int. Union Pure Appl. Chem., 1985)
    • K. Tachibana, T. Okuyama, H. Harima and Y. Urano: Proc. 7th Int. Symp. Plasma Chem., Eindhoven, 1985 (Int. Union Pure Appl. Chem., 1985), Pure Appl. Chem. 57 (1985) 588.
    • (1985) Pure Appl. Chem. , vol.57 , pp. 588
    • Tachibana, K.1    Okuyama, T.2    Harima, H.3    Urano, Y.4
  • 22
    • 0021650838 scopus 로고
    • ed. J. I. Pankove Academic, Orlando
    • F. J. Kampas: Semiconductors and Semimetals, ed. J. I. Pankove (Academic, Orlando, 1984) Vol. 21A, p. 153.
    • (1984) Semiconductors and Semimetals , vol.21 A , pp. 153
    • Kampas, F.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.