Microwave measurements of effective dielectric constant of semiconductor waveguides via periodic-structure photoexcitation

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 3, 1997, Pages 717-721

  Platte, Walter ^a  

^a HELMUT SCHMIDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DIFFRACTION GRATINGS; LIGHTING; MASKS; PERMITTIVITY; PHOTOCONDUCTIVITY; SEMICONDUCTING FILMS; TRANSMISSION LINE THEORY; WAVEGUIDES;

LIGHT INDUCED GENERATING; PHOTOCONDUCTIVITY GRATING; SEMICONDUCTOR WAVEGUIDE;

MICROWAVE MEASUREMENT;

EID: 0031167408     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.585439     Document Type: Article

References (14)

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