Reversible and irreversible hydrogen absorption in Ni67-xCuxZr33 glasses monitored by in situ resistivity measurements

Materials Science and Engineering: A

Volumn 226-228, Issue , 1997, Pages 938-942

  Garaguly, J ^a   Lovas, A ^b   Cziraki A ^c   Reybold, M ^d   Takacs J ^a   Wetzig, K ^d  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^c EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^d IFW DRESDEN   (Germany)

Author keywords

Hydrogen absorption; Metallic glasses; Phase separation; Transport properties

Indexed keywords

ABSORPTION; DESORPTION; ELECTRIC CONDUCTIVITY MEASUREMENT; GAS CHROMATOGRAPHY; HYDROGEN; NICKEL ALLOYS; PHASE SEPARATION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES; VACUUM APPLICATIONS;

SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

METALLIC GLASS;

EID: 0031167252     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(96)10822-4     Document Type: Article

References (10)

1. K. Aoki, M. Kamachi and T. Masumoto, Sci. Rep, RITU A, 31 (1) (1983) 191.
2. L.K. Varga, A. Lovas, I. Bakonyi, E. Tóth-Kádár and K. Tompa, Z. Phys. Chem. Bd., 183 (1994) 73.
3. I. Bakonyi, E. Tóth-Kádár, J. Tóth, K. Tompa, A. Lovas and É. Zsoldos, Z. Phys. Chem. N.F., 163 (1989) 367.
4. Y. Yamada and K. Tanaka, Trans. Jpn. Inst. Met., 27 (6) (1986) 409.
5. F. Spit, K. Blok, E. Hendriks, G. Winkels, W. Turkenburg, J.W. Drijver and S. Radelaar, Proc. 4th Int. Conf. Rapidly Quenched Metals, Sendai, Japan, 1981, pp. 1635-1656.
6. L.K. Varga, A. Lovas and J. Garaguly, to be published.
7. A. Cziráki, B. Fogarassy, K. Tompa, I. Bakonyi, A. Lovas and H.E. Schone, Z. Phys. Chem. N.F., 163 (1989) 355.
8. A. Cziráki, B. Fogarassy, I. Nagy, A. Lovas, E. Tóth-Kádár and I. Bakonyi, J. Magn. Mater., 83 (1990) 360.
9. I. Nagy, I. Bakonyi, A. Lovas, E. Tóth-Kádár, K. Tompa, A. Cziráki and B. Fogarassy, J. Less-Common Met., 167 (1991) 283.
10. A. Cziráki, B. Fogarassy, I. Nagy, I. Bakonyi, K. Tompa, B. Arnold and K. Wetzig, in K. Kuo and J. Jao (Eds.), Int. Symp. Electron Microscopy, World Scientific, Singapore, 1990, p. 391.