Microcavity effects in thin-film electroluminescence

Journal of Luminescence

Volumn 72-74, Issue , 1997, Pages 1002-1004

  Mueller, Gerd O ^a   Mueller Mach, Regina ^a   Alinsog, Elmer ^a   Lee, Hakchu ^b   Harrison, Douglas ^b  

^a HEWLETT PACKARD LABORATORIES   (United States)

^b HEWLETT PACKARD COMPANY   (United States)

Author keywords

II VI compounds; Microcavity; Optical spectra; Thin film electroluminescence; ZnS

Indexed keywords

ELECTRONIC DENSITY OF STATES; FABRY-PEROT INTERFEROMETERS; LUMINESCENT DEVICES; SEMICONDUCTING ZINC COMPOUNDS; SPECTRUM ANALYSIS; THIN FILM DEVICES;

DIELECTRIC REFLECTOR; MICROCAVITY EFFECTS; THIN FILM ELECTROLUMINESCENCE;

ELECTROLUMINESCENCE;

EID: 0031167207     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2313(96)00331-6     Document Type: Article

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