Bayesian techniques to reduce the sample size in automotive electronics attribute testing

Microelectronics Reliability

Volumn 37, Issue 6, 1997, Pages 879-883

  Kleyner, Andre ^a   Bhagath, Shrikar ^a   Gasparini, Mauro ^b   Robinson, Jeffrey ^c   Bender, Mark ^a  

^a DELPHI CORPORATION   (United States)

^b PURDUE UNIVERSITY   (United States)

^c GM Research Lab   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOBILE MANUFACTURE; CALCULATIONS; PROBABILITY; RANDOM PROCESSES; RELIABILITY; STATISTICAL METHODS;

BAYESIAN TECHNIQUE; SUCCESS RUN FORMULA;

ELECTRONIC EQUIPMENT TESTING;

EID: 0031167110     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00253-3     Document Type: Article

References (7)

1. Johnson, L. G., GMR Rel. Manual, GMR-302, General Motors Research Laboratories. Aug. 1960.
2. Benedict, A. G., Reliability-confidence combination for small sample tests of aerospace ordnance items. NASA Technical Report, pp. 32-1165. JPL, California Institute of Technology, Pasadena, 1967.
3. Clopper, C. J. and Pearson, E. S., The use of confidence or fiducial limits illustrated in case of the binomial. Biometrika, 1934, 26, 404-413.
4. Martz, H. F. and Waller, R. A., The basics of Bayesian reliability estimation from attribute test data. Los Alamos Scientific Laboratory, Report UC-79p. February 1976.
5. Martz, H. F. and Waller, R. A., Bayesian Reliability Analysis. John Wiley, 1982.
6. Copas, J. B., Empirical Bayes methods and repeated use of a standard. Biometrika, 1972, 59, 349-360.
7. Savchuk, V. and Martz, H., Bayes reliability estimation using multiple sources of prior information: binomial sampling. IEEE Transactions on Reliability, March 1994, 43, 138-144.