Polarization dependence of the response of micrometer and submicrometer InGaAs metal-semiconductor-metal photodetectors

IEEE Photonics Technology Letters

Volumn 9, Issue 6, 1997, Pages 809-811

  Bottcher E H ^a   Droge E ^a   Bimberg, D ^a   Umbach, A ^b   Engel, H ^b   Collischon, M ^c  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b FRAUNHOFER HEINRICH HERTZ INSTITUTE   (Germany)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ELECTRODES; LIGHT POLARIZATION; QUANTUM EFFICIENCY; SEMICONDUCTING GALLIUM ARSENIDE;

LAMELLAR GRATING STRUCTURE; OPTICAL PULSES; OPTICAL WAVELENGTH;

PHOTODETECTORS;

EID: 0031166680     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.584998     Document Type: Article

References (13)

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