Electron spin resonance analysis of lattice defects in polycrystalline aluminum nitride

Journal of the American Ceramic Society

Volumn 80, Issue 6, 1997, Pages 1612-1614

  Nakahata, Seiji ^a   Sogabe, Kouichi ^a,b   Matsuura, Takahiro ^a,b   Yamakawa, Akira ^a,b  

^a SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

^b AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; COMPOSITION EFFECTS; CRYSTAL DEFECTS; CRYSTAL LATTICES; ELECTRON SPIN RESONANCE SPECTROSCOPY; IMPURITIES; OXYGEN; POLYCRYSTALLINE MATERIALS; THERMAL CONDUCTIVITY OF SOLIDS;

ALUMINUM NITRIDES; LASER FLASH METHOD;

SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 0031166386     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb03027.x     Document Type: Article

References (14)

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