N-type negative resistance in M/NiS2-xSex/M structures

Physica Status Solidi (A) Applied Research

Volumn 161, Issue 2, 1997, Pages 577-580

  Chudnovskii, F A ^a   Pergament, A L ^b   Stefanovich, G B ^b   Somasundaram, P ^c   Honig, J M ^c  

^a IOFFE INSTITUTE   (Russian Federation)

^b PETROZAVODSK STATE UNIVERSITY   (Russian Federation)

^c PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC VARIABLES MEASUREMENT; NEGATIVE RESISTANCE; NICKEL COMPOUNDS; PHASE TRANSITIONS; THIN FILMS;

NICKEL SULFUR SELENIDE;

SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0031166269     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199706)161:2<577::AID-PSSA577>3.0.CO;2-1     Document Type: Article

References (6)

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3. X. YAO and J. M. HONIG, Mater. Res. Bull. 29, 709 (1994).
4. X. YAO, S. N. EHRLICH, G. LIEDL, and J. M. HONIG, The Metal-Nonmetal Transition Revisited, Ed. P. P. EDWARDS and C. N. R. RAO, Taylor & Francis, London 1995 (p. 127).
5. B. P. ZAKHARCHENYA, V. P. MALINENKO, G. B. STEFANOVICH, M. YU. TERMAN, and F. A. CHUDNOVSKII, Zh. Tekh. Fiz., Pisma 11, 108 (1985) (Soviet Phys. - Tech. Phys. Letters 11, 95 (1985)).
6. B. P. ZAKHARCHENYA, V. P. MALINENKO, G. B. STEFANOVICH, M. YU. TERMAN, and F. A. CHUDNOVSKII, Zh. Tekh. Fiz., Pisma 11, 108 (1985) (Soviet Phys. - Tech. Phys. Letters 11, 95 (1985)).