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Volumn 5, Issue 2, 1997, Pages 197-213

Empirical Evidence of Reliability Growth in Large-Scale Networks

Author keywords

Fault analysis; FTS2000; Network reliability; NHPP

Indexed keywords

FAILURE ANALYSIS; MATHEMATICAL MODELS; RANDOM PROCESSES; RELIABILITY; TELECOMMUNICATION SERVICES;

EID: 0031166133     PISSN: 10647570     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018774912261     Document Type: Article
Times cited : (4)

References (8)
  • 3
    • 2342644791 scopus 로고
    • Washington, DC., adopted February 13, 1992, released February 27
    • FCC Report and Order 92-58, CC Docket No. 91-273 (7FCC Record 2010), Federal Communications Commission, Washington, DC., adopted February 13, 1992, released February 27, 1992.
    • (1992) Federal Communications Commission
  • 4
    • 84937650085 scopus 로고
    • Learning curve approach to reliability monitoring
    • As cited by M. Xie and M. Zhoa, 1993 and by S. Yamada and S. Osaki, 1983
    • J. T. Duane, Learning curve approach to reliability monitoring. IEEE Transactions on Aerospace, Vol. 2, pp. 563-566, 1963. [As cited by M. Xie and M. Zhoa, 1993 and by S. Yamada and S. Osaki, 1983].
    • (1963) IEEE Transactions on Aerospace , vol.2 , pp. 563-566
    • Duane, J.T.1
  • 7
    • 0027283137 scopus 로고
    • On some reliability growth models with simple graphical interpretations
    • M. Xie and M. Zhao, On some reliability growth models with simple graphical interpretations. Microelectronics Reliability, Vol. 33, pp. 149-167, 1993.
    • (1993) Microelectronics Reliability , vol.33 , pp. 149-167
    • Xie, M.1    Zhao, M.2
  • 8
    • 0020497658 scopus 로고
    • Reliability growth models for hardware and software systems based on nonhomogeneous poisson processes: A survey
    • S. Yamada and S. Osaki, Reliability growth models for hardware and software systems based on nonhomogeneous poisson processes: a survey. Microelectronics Reliability, Vol. 23, pp. 91-112, 1983.
    • (1983) Microelectronics Reliability , vol.23 , pp. 91-112
    • Yamada, S.1    Osaki, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.