Characterization of porous silicon by means of photoacoustic spectroscopy

Thin Solid Films

Volumn 302, Issue 1-2, 1997, Pages 51-53

  Ohmukai, Masato ^a   Tsutsumi, Yasuo ^a  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Luminescence; Nanostructures; Optical spectroscopy; Silicon

Indexed keywords

LIGHT ABSORPTION; NANOSTRUCTURED MATERIALS; PHOTOACOUSTIC SPECTROSCOPY; PHOTOLUMINESCENCE; RELAXATION PROCESSES;

NONRADIATIVE RELAXATION PROCESSES;

POROUS SILICON;

EID: 0031166107     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09566-1     Document Type: Article

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