Dielectric resonators as microwave characterization tools

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 2, 1997, Pages 2018-2021

  Moser, E K ^a   Naishadham, K ^b  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b 207 Russ Engineering Center   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC DEVICES; HIGH TEMPERATURE SUPERCONDUCTORS; MATHEMATICAL MODELS; MICROWAVES; Q FACTOR MEASUREMENT; SAPPHIRE;

MICROWAVE CHARACTERIZATION TOOLS;

RESONATORS;

EID: 0031165612     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.620986     Document Type: Article

References (10)

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3. c superconductor-sapphire microwave resonator with extremely high Q-values up to 90K, "IEEE Trans. MTT, vol. 40, pg. 2424, 1992.
4. A. P. Mourachkine and A. R. F. Barel, "Microwave measurement of surface resistance by the parallel plate dielectric resonator method," IEEE Trans. MTT, vol. 43, pp. 544-551, March, 1995.
5. K. Naishadham, "Surface resistance calculations from dielectric resonator measurements," Final Report for AFOSR Summer Research Program, Sept. , 1995. (unpublished)
6. W. P. Wheless and D. Kajfez, "Experimental characterization of multi-moded microwave resonators using automated network analyzer," IEEE Trans. MTT, vol. 35, pg. 1263, 1987.
7. E. L. Ginzton, Microwave Measurements, New York: McGraw-Hill, 1957, p. 408.
8. c superconductors," IEEE Trans. MTT, vol. 39, pg. 1530, 1991.
9. D. Kajfez, Q Factor, Oxford. MS: Vector Fields. 1994.
10. K. Naishadham, "Least squares Marquardt calibration of dielectric resonator measurements," Final Report for AFOSR Summer Research Program, Sept. , 1996. (unpublished)