High-resolution absorption measurements by use of two-tone frequency-modulation spectroscopy with diode lasers

Applied Optics

Volumn 36, Issue 18, 1997, Pages 4043-4054

  Avetisov, Viacheslav G ^a,b   Kauranen, Peter ^a  

^a LUND INSTITUTE OF TECHNOLOGY   (Sweden)

^b Prost Stabels Vei 22   (Norway)

Author keywords

Diode laser; Frequency modulation spectroscopy; High resolution spectroscopy; Oxygen

Indexed keywords

FREQUENCY MODULATION; LASER BEAMS; LASER PULSES; LEAST SQUARES APPROXIMATIONS; LIGHT ABSORPTION; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; OXYGEN; PRESSURE EFFECTS; SCANNING; SEMICONDUCTOR LASERS; SENSITIVITY ANALYSIS;

COLLISIONAL NARROWING; DUAL BEAM SUBTRACTION SCHEME; FREQUENCY MODULATION INDEX; GALATRY PROFILE; LEAST SQUARES FITTING; LINE SHAPE MEASUREMENT; TWO TONE FREQUENCY MODULATION SPECTROSCOPY; VOIGT LINE PROFILE; WAVEFORM;

ABSORPTION SPECTROSCOPY;

EID: 0031165182     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.004043     Document Type: Article

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