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Volumn 30, Issue 12, 1997, Pages
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Low density of states at the epitaxial CaF2-Si(111) interface
a a a b,c b |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONIC DENSITY OF STATES;
ENERGY GAP;
EPITAXIAL GROWTH;
FILM GROWTH;
FLUORSPAR;
PHOTOELECTRON SPECTROSCOPY;
SEMICONDUCTING SILICON;
THIN FILMS;
CALCIUM FLUORIDE;
EPITAXIAL FILMS;
INTERFACES (MATERIALS);
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EID: 0031165086
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/30/12/002 Document Type: Article |
Times cited : (3)
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References (12)
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