Low frequency voltage noise in high temperature superconductor josephson junctions

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 3, 1997, Pages 2719-2722

  Marx, A ^a,b   Alff, L ^a   Gross, R ^a  

^a UNIVERSITY OF COLOGNE   (Germany)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENTS; CRYSTAL DEFECTS; ELECTRIC RESISTANCE; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; NATURAL FREQUENCIES; SIGNAL NOISE MEASUREMENT; THERMAL EFFECTS;

BICRYSTALS; CHARGE TRAPPING; INTRINSICALLY SHUNTED JUNCTION (ISJ) MODEL; LOW FREQUENCY VOLTAGE NOISE; RAMP EDGE JUNCTIONS;

JOSEPHSON JUNCTION DEVICES;

EID: 0031165037     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.621799     Document Type: Article

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