Impurity-induced degradation at zirconia/sapphire interfaces

Journal of Materials Science

Volumn 32, Issue 11, 1997, Pages 2903-2910

  Stough, M A ^a   Hellmann, J R ^a   Angelone, M S ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC COATINGS; COMPOSITION EFFECTS; DEGRADATION; ETCHING; GRAIN BOUNDARIES; IMPURITIES; MICROANALYSIS; PITTING; POLYCRYSTALLINE MATERIALS; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; ZIRCONIA;

ELECTRON PROBE MICROANALYSIS (EPMA);

CERAMIC MATRIX COMPOSITES;

EID: 0031164911     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018680602276     Document Type: Article

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