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Volumn 23, Issue 4, 1997, Pages 72-84
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Measuring yield curve risk using principal components analysis, value at risk, and key rate durations: Directing light into the black box
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031164806
PISSN: 00954918
EISSN: None
Source Type: Journal
DOI: 10.3905/jpm.1997.409612 Document Type: Article |
Times cited : (17)
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References (18)
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