Built-in self-test design of current-mode algorithmic analog-to-digital converters

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 3, 1997, Pages 667-671

  Wey, Chin Long ^a,b  

^a IEEE   (United States)

^b Michigan State University   (United States)

Author keywords

Algorithmic analog to digital (A D) converter; BIST design; Built in self test (BIST); Current mode; Self testability; Test generation

Indexed keywords

ANALOG TO DIGITAL CONVERSION; ELECTRONIC EQUIPMENT TESTING; ERROR DETECTION; LINEAR INTEGRATED CIRCUITS; MOS DEVICES; OPERATIONAL AMPLIFIERS; SWITCHING;

ALGORITHMIC ANALOG TO DIGITAL CONVERTER; BUILT IN SELF TEST DESIGN; CONCURRENT ERROR DETECTION; ERROR INDICATOR;

ELECTRIC CONVERTERS;

EID: 0031164176     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.585427     Document Type: Article

References (12)

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