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Volumn 392, Issue 1-3, 1997, Pages 465-470

Application of the electron-counting method to low-Z elemental analysis

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EFFICIENCY; ELECTRONS; IONIZATION OF GASES; SCANNING ELECTRON MICROSCOPY; SPECTRUM ANALYSIS; X RAY SPECTROSCOPY;

EID: 0031163717     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00236-2     Document Type: Article
Times cited : (6)

References (9)
  • 1
    • 30244534155 scopus 로고    scopus 로고
    • Oxford Instruments, Microanalysis group, Halifax Rd, High Wycombe, Bucks HP12 3SE, UK
    • Oxford Instruments, Microanalysis group, Halifax Rd, High Wycombe, Bucks HP12 3SE, UK.
  • 7
    • 0031494392 scopus 로고    scopus 로고
    • Sub-keV X-ray spectroscopy with a low-pressure electron counting detector
    • preprint no. WIS-96/32/July-PH, in press
    • A. Pansky, A. Breskin and R. Chechik, Sub-keV X-ray spectroscopy with a low-pressure electron counting detector, preprint no. WIS-96/32/July-PH, X-ray Spectrometry 26, in press.
    • X-ray Spectrometry , vol.26
    • Pansky, A.1    Breskin, A.2    Chechik, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.