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Volumn 20, Issue 2, 1997, Pages 220-224

Thermal analysis of GaAs power monolithic microwave IC's mounted with epoxy attachment

Author keywords

Attachment; Chip thickness; Epoxy; GaAs; Junction temperature; MMIC; Power FET; Solder; Thermal resistance; Uniplanar coplanar waveguide

Indexed keywords

COMPUTER SIMULATION; COST EFFECTIVENESS; EPOXY RESINS; HEAT RESISTANCE; MESFET DEVICES; SCHOTTKY BARRIER DIODES; SEMICONDUCTING GALLIUM ARSENIDE; THERMAL CONDUCTIVITY OF SOLIDS; THERMOANALYSIS;

EID: 0031163627     PISSN: 10709886     EISSN: None     Source Type: Journal    
DOI: 10.1109/95.588577     Document Type: Article
Times cited : (12)

References (11)
  • 2
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    • Two-dimensional thermal modeling of power monolithic microwave integrated circuits (MMIC's)
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    • M. S. Fan, A. Christou, and M. G. Pecht, "Two-dimensional thermal modeling of power monolithic microwave integrated circuits (MMIC's)," IEEE Trans. Electron Devices, vol. 39, pp. 1075-1079, May 1992.
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    • Fan, M.S.1    Christou, A.2    Pecht, M.G.3
  • 3
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    • MMIC thermal analysis
    • A. Christou, Ed. New York: Wiley, ch. 9
    • M. S. Fan, "MMIC thermal analysis," in Reliability of Gallium Arsenide MMIC's, A. Christou, Ed. New York: Wiley, 1992, ch. 9.
    • (1992) Reliability of Gallium Arsenide MMIC's
    • Fan, M.S.1
  • 4
    • 0022097946 scopus 로고
    • A critical review of VLSI die-attachment in high reliability applications
    • July
    • R. K. Shukla and N. P. Mencinger, "A critical review of VLSI die-attachment in high reliability applications," Solid State Technol., vol. 28, pp. 67-74, July 1985.
    • (1985) Solid State Technol. , vol.28 , pp. 67-74
    • Shukla, R.K.1    Mencinger, N.P.2
  • 5
    • 0027591164 scopus 로고
    • Thermal modeling of power gallium arsenide microwave integrated circuits
    • May
    • P. W. Webb, "Thermal modeling of power gallium arsenide microwave integrated circuits," IEEE Trans. Electron Devices, vol. 40, pp. 867-877, May 1993.
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 867-877
    • Webb, P.W.1
  • 6
    • 33748675667 scopus 로고
    • A proposed method for testing thermal resistance of MESFETS
    • Nov.
    • B. S. Siegal, "A proposed method for testing thermal resistance of MESFETS," Microwave Syst. News, pp. 67-70, Nov. 1977.
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  • 7
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    • Thermal resistance of GaAs field-effect transistors
    • Washington, DC
    • H. Fukui, "Thermal resistance of GaAs field-effect transistors," in IEDM Tech. Dig., Washington, DC, 1980, pp. 118-121.
    • (1980) IEDM Tech. Dig. , pp. 118-121
    • Fukui, H.1
  • 8
    • 33748649644 scopus 로고
    • Thermal analysis of GaAs MESFET's
    • Aug.
    • A. Malhotra, S. Bhagath, and A. Christou, "Thermal analysis of GaAs MESFET's," Microwave J., vol. 36, no. 8, pp. 98-105, Aug. 1993.
    • (1993) Microwave J. , vol.36 , Issue.8 , pp. 98-105
    • Malhotra, A.1    Bhagath, S.2    Christou, A.3
  • 9
    • 33748651198 scopus 로고    scopus 로고
    • Hewlett-Packard Application Note 356-1, p. 11
    • Hewlett-Packard Application Note 356-1, p. 11.
  • 10
    • 33747922749 scopus 로고
    • Transistors junction temperature as a function of time
    • Apr.
    • K. E. Morteson, "Transistors junction temperature as a function of time," in Proc. IRE, Apr. 1957, vol. 45, no. 4, pp. 504-513.
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    • Morteson, K.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.