-
1
-
-
33748670041
-
Technology for miniaturization of MMIC's
-
Tokyo, Japan
-
T. Tokumitsu and M. Aikawa, "Technology for miniaturization of MMIC's," in MWE'92 Microwave Workshop Dig. IEICE, Tokyo, Japan, 1992, pp. 293-298.
-
(1992)
MWE'92 Microwave Workshop Dig. IEICE
, pp. 293-298
-
-
Tokumitsu, T.1
Aikawa, M.2
-
2
-
-
0026869451
-
Two-dimensional thermal modeling of power monolithic microwave integrated circuits (MMIC's)
-
May
-
M. S. Fan, A. Christou, and M. G. Pecht, "Two-dimensional thermal modeling of power monolithic microwave integrated circuits (MMIC's)," IEEE Trans. Electron Devices, vol. 39, pp. 1075-1079, May 1992.
-
(1992)
IEEE Trans. Electron Devices
, vol.39
, pp. 1075-1079
-
-
Fan, M.S.1
Christou, A.2
Pecht, M.G.3
-
3
-
-
33748667728
-
MMIC thermal analysis
-
A. Christou, Ed. New York: Wiley, ch. 9
-
M. S. Fan, "MMIC thermal analysis," in Reliability of Gallium Arsenide MMIC's, A. Christou, Ed. New York: Wiley, 1992, ch. 9.
-
(1992)
Reliability of Gallium Arsenide MMIC's
-
-
Fan, M.S.1
-
4
-
-
0022097946
-
A critical review of VLSI die-attachment in high reliability applications
-
July
-
R. K. Shukla and N. P. Mencinger, "A critical review of VLSI die-attachment in high reliability applications," Solid State Technol., vol. 28, pp. 67-74, July 1985.
-
(1985)
Solid State Technol.
, vol.28
, pp. 67-74
-
-
Shukla, R.K.1
Mencinger, N.P.2
-
5
-
-
0027591164
-
Thermal modeling of power gallium arsenide microwave integrated circuits
-
May
-
P. W. Webb, "Thermal modeling of power gallium arsenide microwave integrated circuits," IEEE Trans. Electron Devices, vol. 40, pp. 867-877, May 1993.
-
(1993)
IEEE Trans. Electron Devices
, vol.40
, pp. 867-877
-
-
Webb, P.W.1
-
6
-
-
33748675667
-
A proposed method for testing thermal resistance of MESFETS
-
Nov.
-
B. S. Siegal, "A proposed method for testing thermal resistance of MESFETS," Microwave Syst. News, pp. 67-70, Nov. 1977.
-
(1977)
Microwave Syst. News
, pp. 67-70
-
-
Siegal, B.S.1
-
7
-
-
0019244335
-
Thermal resistance of GaAs field-effect transistors
-
Washington, DC
-
H. Fukui, "Thermal resistance of GaAs field-effect transistors," in IEDM Tech. Dig., Washington, DC, 1980, pp. 118-121.
-
(1980)
IEDM Tech. Dig.
, pp. 118-121
-
-
Fukui, H.1
-
8
-
-
33748649644
-
Thermal analysis of GaAs MESFET's
-
Aug.
-
A. Malhotra, S. Bhagath, and A. Christou, "Thermal analysis of GaAs MESFET's," Microwave J., vol. 36, no. 8, pp. 98-105, Aug. 1993.
-
(1993)
Microwave J.
, vol.36
, Issue.8
, pp. 98-105
-
-
Malhotra, A.1
Bhagath, S.2
Christou, A.3
-
9
-
-
33748651198
-
-
Hewlett-Packard Application Note 356-1, p. 11
-
Hewlett-Packard Application Note 356-1, p. 11.
-
-
-
-
10
-
-
33747922749
-
Transistors junction temperature as a function of time
-
Apr.
-
K. E. Morteson, "Transistors junction temperature as a function of time," in Proc. IRE, Apr. 1957, vol. 45, no. 4, pp. 504-513.
-
(1957)
Proc. IRE
, vol.45
, Issue.4
, pp. 504-513
-
-
Morteson, K.E.1
-
11
-
-
0016986882
-
Thermal characterization of power transistors
-
Aug.
-
F. F. Oettinger, D. L. Blackburn, and S. Rubin, "Thermal characterization of power transistors," IEEE Trans. Electron Devices, vol. 23, pp. 831-838, Aug. 1976.
-
(1976)
IEEE Trans. Electron Devices
, vol.23
, pp. 831-838
-
-
Oettinger, F.F.1
Blackburn, D.L.2
Rubin, S.3
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