Analysis of light emitting diodes by X-ray reflectivity measurements

Thin Solid Films

Volumn 302, Issue 1-2, 1997, Pages 214-222

  Christ, T ^a   Geffart, F ^a   Glusen B ^a   Kettner, A ^a   Lussem G ^a   Schafer O ^a   Stumpflen V ^a   Wendorff, J H ^a   Tsukruk, V V ^b  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

^b Parkview Campus   (United States)

Author keywords

Electronic devices; Polymers; Surface structure: X ray diffraction

Indexed keywords

ELECTRODES; LIGHT REFLECTION; MULTILAYERS; NONDESTRUCTIVE EXAMINATION; PLASTIC FILMS; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

ORGANIC FILMS; X RAY REFLECTOMETRY;

LIGHT EMITTING DIODES;

EID: 0031163620     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09542-9     Document Type: Article

References (24)

1. J.H. Burroughes, D.D.C. Bradley, A.R. Brown, R.N. Marks, K. Mackay, R.H. Friend, P.L. Burns and A.B. Holmes, Nature, 347 (1990) 539.
2. D. Braun and A.J. Heeger, Appl. Phys. Lett., 58 (1991) 1982.
3. H. Vestweber, A. Greiner, U. Lemmer, R.F. Mahrt, R. Richert, W. Heitz and H. Bässler, Adv. Mater., 4 (1992) 661.
4. G. Lüssem, R. Festag, A. Greiner, C. Schmidt. C. Unterlechner, W. Heitz, J.H. Wendorff, M. Hopmeier and J. Feldmann, Adv. Mater., 7 (1995) 923.
5. G. Lüssem, F. Geffarth, A. Greiner, W. Heitz, M. Hopmeier, M. Oberski, C. Unterlechner and J.H. Wendorff, Liq. Cryst., 21 (1996) 903.
6. T. Christ, B. Glüsen, A. Greiner, A. Kettner, R. Sander, V. Stümpflen, V.V. Tsukruk and J.H. Wendorff, Adv. Mater., 9 (1997) 48.
7. J. Lekner, Theory of Reflection, Martinus Nijhoff, Dordrecht, The Netherlands, 1987; S.K. Sinha, E.B. Sirota, S. Garoff and H.B. Stanley, Phys. Rev. B, 38 (1988) 2297; S.A. Stepanov, E.A. Kondrashkina, M. Schmidbauer, R. Kohler, J. Pfeiffer, T. Jach and A.Yu. Sdouvorov, Phys. Rev. B, 54 (1996) 8150.
8. J. Lekner, Theory of Reflection, Martinus Nijhoff, Dordrecht, The Netherlands, 1987; S.K. Sinha, E.B. Sirota, S. Garoff and H.B. Stanley, Phys. Rev. B, 38 (1988) 2297; S.A. Stepanov, E.A. Kondrashkina, M. Schmidbauer, R. Kohler, J. Pfeiffer, T. Jach and A.Yu. Sdouvorov, Phys. Rev. B, 54 (1996) 8150.
9. J. Lekner, Theory of Reflection, Martinus Nijhoff, Dordrecht, The Netherlands, 1987; S.K. Sinha, E.B. Sirota, S. Garoff and H.B. Stanley, Phys. Rev. B, 38 (1988) 2297; S.A. Stepanov, E.A. Kondrashkina, M. Schmidbauer, R. Kohler, J. Pfeiffer, T. Jach and A.Yu. Sdouvorov, Phys. Rev. B, 54 (1996) 8150.
10. T.P. Russell, Mater. Sci. Rep., 5 (1990) 171; M. Stamm, Adv. Polym. Sci., 100 (1992) 358; M. Foster, Crit. Rev. Anal. Chem., 24 (1993) 179.
11. T.P. Russell, Mater. Sci. Rep., 5 (1990) 171; M. Stamm, Adv. Polym. Sci., 100 (1992) 358; M. Foster, Crit. Rev. Anal. Chem., 24 (1993) 179.
12. T.P. Russell, Mater. Sci. Rep., 5 (1990) 171; M. Stamm, Adv. Polym. Sci., 100 (1992) 358; M. Foster, Crit. Rev. Anal. Chem., 24 (1993) 179.
13. REFSIM 1.0, Siemens AG, Karlsruhe, 1994.
14. O. Kratky and O. Glatter (eds.), Small-Angle X-ray Scattering, Academic Press, London, 1982.
15. D. Adam, F. Closs, T. Frey, D. Funhoff, D. Haarer, H. Ringsdorf, P. Schuhmacher and K. Siemensmeyer, Phys. Rev. Lett., 70, (1993) 457.
16. D. Adam, P. Schuhmacher, J. Simmerer, L. Häußling, K. Siemensmeyer, K.H. Etzbach. H. Ringsdorf and D. Haarer, Nature, 371 (1994) 141.
17. D. Adam, P. Schuhmacher, J. Simmerer, L. Häußling, W. Paulus, K. Siemensmeyer, K.H. Etzbach, H. Ringsdorf and D. Haarer, Adv. Mater., 7 (1995) 276.
18. J. Simmerer, B. Glüsen, W. Paulus, A. Kettner, P. Schuhmacher, D. Adam, K.H. Etzbach, K. Siemensmeyer, J.H. Wendorff, H. Rings dorf and D. Haarer, Adv. Mater., 8 (1996) 815.
19. S. Chandrasekhar, B.K. Sadashiva and K.A. Suresh, Pramana, 9 (1977) 471.
20. A.M. Levelut, J. Chem. Phys., 80 (1983) 149.
21. O. Karthaus, H. Ringsdorf, V.V. Tsukruk and J.H. Wendorff, Langmuir, 8 (1992) 2279; V.V. Tsukruk, J.H. Wendorff, O. Karthaus and H. Ringsdorf, Langmuir, 9 (1993) 614.
22. O. Karthaus, H. Ringsdorf, V.V. Tsukruk and J.H. Wendorff, Langmuir, 8 (1992) 2279; V.V. Tsukruk, J.H. Wendorff, O. Karthaus and H. Ringsdorf, Langmuir, 9 (1993) 614.
23. V.V. Tsukruk, D.H. Rencker, H. Bengs and H. Ringsdorf, Langmuir, 9 (1993) 2141
24. V.V. Tsukruk, H. Bengs and H. Ringsdorf, Langmuir, 12 (1996) 754.