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Volumn 46, Issue 3, 1997, Pages 239-248

Reactive ion etching (RIE) as a method for texturing polycrystalline silicon solar cells

Author keywords

Polycrystalline silicon; Polysilicon; Reactive Ion Etching; Reflectivity; Texturing

Indexed keywords

REFLECTIVITY MEASUREMENT; WET ANISOTROPIC ETCH TECHNIQUE;

EID: 0031163170     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(97)00011-1     Document Type: Article
Times cited : (81)

References (14)
  • 1
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    • U.S. patent No. 3 487 223
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    • St. John, A.E.1
  • 3
    • 85033099084 scopus 로고
    • 0-7803-1220-1/93, 1993
    • R. Brendel, 0-7803-1220-1/93, IEEE, 1993, (1993) 252.
    • (1993) IEEE , pp. 252
    • Brendel, R.1
  • 4
    • 85033114970 scopus 로고
    • Ph.D. Thesis, University of New South Wales, June
    • P Campbell., Ph.D. Thesis, University of New South Wales, June 1989.
    • (1989)
    • Campbell, P.1
  • 5
    • 0040527116 scopus 로고
    • Ph.D. Thesis, UNSW, ch. 5
    • S. Narayanan, Ph.D. Thesis, UNSW, ch. 5, 1989.
    • (1989)
    • Narayanan, S.1
  • 14
    • 0040527115 scopus 로고    scopus 로고
    • MPI-FKF D-70569 Stuttgart, Germany
    • R. Brendel, Sunrays 1.3, MPI-FKF D-70569 Stuttgart, Germany.
    • Sunrays 1.3
    • Brendel, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.