Diagnosis and correction of multiple logic design errors in digital circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 5, Issue 2, 1997, Pages 233-237

  Chung, Pi Yu ^a   Hajj, Ibrahim N ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

Design error; Diagnosis; Digital circuits; Error correction

Indexed keywords

ALGORITHMS; ERROR CORRECTION; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN;

GATE LEVEL NETLIST;

DIGITAL CIRCUITS;

EID: 0031162708     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/92.585227     Document Type: Article

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