Interference scanning optical probe microscopy

Applied Physics Letters

Volumn 70, Issue 26, 1997, Pages 3507-3509

  Bacsa, W S ^a   Kulik, A ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRIC FIELD EFFECTS; LIGHT SCATTERING; OPTICAL RESOLVING POWER; PHASE SHIFT; PROBES; REFLECTION; SCANNING; WAVE INTERFERENCE;

INCIDENT BEAMS; INTERFERENCE SCANNING OPTICAL PROBE MICROSCOPY; REFLECTION GEOMETRY;

OPTICS;

EID: 0031162286     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119215     Document Type: Article

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