Investigation of critical currents in ybco tracks over steps in srtio3 substrates using low temperature sem beam induced voltage contrast

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 2, 1997, Pages 2142-2145

  Foulds, S A L ^a   Abell, J S ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); OXIDE SUPERCONDUCTORS; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; SURFACE ROUGHNESS; YTTRIUM COMPOUNDS;

LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY (LTSEM);

SUPERCONDUCTING FILMS;

EID: 0031162176     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.621016     Document Type: Article

References (9)

1. 7 multilayer structures" Appl. Phys. Lett., vol. 64. pp. 918-920. February 1994.
2. 7 multilayer structures", Physica C, vol. 235, pp. 712-722, 1994.
3. 3 substrates". Physica C. vol. 175. pp. 545-554, 1991.
4. S. Tanaka, T. Matsuura and H. Itozaki, "Step-edge junction of YBCO thin films on MgO substrates", IEEE Trans. Appl. Supercond., vol. 3, pp. 2365-2368, March 1993.
5. G. A. Wagner, R. E. Somekh and J. E. Evetts. "A novel heater and optimized temperature control for high Tc thin film preparation", Inst. Phys. Conf. Ser., vol 148. pp855-858, 1995.
6. M. G. Hall, J. K. Hulbert and P. N. Zarucki, "The application and programming of an image store for the SEM", Scanning, vol. H. pp 217-226, 1991.
7. J. R. Clem and R. P. Huebener, "Application of low-temperature scanning electron microscopy to superconductors". J. Appl. Phys., vol. 51, pp. 2764-2773, May 1980.
8. J. Talvacchio, M. G. Forrester and J. R. Gavaler, "Properties of passive structures for multilayer HTS digital circuits". IEEE Trans. Appl. Supercond., vol 5. pp. 3139-3142, 1995.
9. A. I. Braginski, "Fabrication of high temperature SQUID magnetometers", NATO ASI book on SQUID Sensors, 1996, in press.