Statistical analysis of the degradation of 2223-BSCCO tapes aged under mechanical stress by the weibull function

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 2, 1997, Pages 1303-1306

  Montanari, G C ^a   Ghinello, I ^b   Gherardi, L ^a   Mele, R ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b Pirelli Labs SpA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; DIFFERENTIATION (CALCULUS); ELECTRIC CURRENT MEASUREMENT; NUMERICAL ANALYSIS; OXIDE SUPERCONDUCTORS; PROBABILITY; PROBABILITY DENSITY FUNCTION; STATISTICAL METHODS; VOLTAGE MEASUREMENT;

SUPERCONDUCTING TAPES; WEIBULL FUNCTIONS;

SUPERCONDUCTING WIRE;

EID: 0031162116     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.620763     Document Type: Article

References (11)

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