Non-optical shear-force detection for scanning near-field optical microscope

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 36, Issue 6, 1997, Pages

  Tamaru, Hiroharu ^a   Miyano, Kenjiro ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; PIEZOELECTRIC MATERIALS; RESONANCE; SHEAR STRESS; VIBRATIONS (MECHANICAL);

SCANNING NEAR FIELD OPTICAL MICROSCOPES (SNOM); SHEAR FORCE DETECTION;

OPTICAL MICROSCOPY;

EID: 0031153560     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.l821     Document Type: Article

References (11)