A novel method for time-resolved characterization of micromagnetic stray fields with scanning probe microscopy

Surface and Interface Analysis

Volumn 25, Issue 7-8, 1997, Pages 533-536

  Bangert, J ^a   Kasim, S ^a   Mertin, W ^a   Kubalek, E ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Magnetic field mapping; Magneto resistive; Micro characterisation; Time resolved current measurement

Indexed keywords

BANDWIDTH; DRAWING (FORMING); ELECTRIC CURRENT MEASUREMENT; IMAGING TECHNIQUES; MAGNETIC FIELD MEASUREMENT; MAGNETORESISTANCE; OPTICAL RESOLVING POWER; WAVEFORM ANALYSIS;

MAGNETIC FIELD MAPPING; MICROMAGNETIC STRAY FIELDS; SCANNING PROBE MICROSCOPY;

MAGNETIC FIELDS;

EID: 0031153357     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199706)25:7/8<533::aid-sia264>3.0.co;2-5     Document Type: Article

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