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Volumn 301, Issue 1-2, 1997, Pages 1-6

Room temperature reduction of MERIE-like plasma-induced interface states

Author keywords

Interfaces; Metal oxide semiconductors; Plasma processing and deposition

Indexed keywords

ANNEALING; CAPACITORS; CRYSTAL DEFECTS; INTERFACES (MATERIALS); PLASMA ETCHING; REACTIVE ION ETCHING;

EID: 0031153332     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09596-X     Document Type: Article
Times cited : (1)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.