Logarithmic dependence of the surface anisotropy on the low-angle X-ray diffraction intensity in Co-based multilayers

Thin Solid Films

Volumn 301, Issue 1-2, 1997, Pages 249-252

  Kim, Jin Hong ^a   Shin, Sung Chul ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Anisotropy; Magnetic properties and measurements; Surface and interface states; X ray diffraction

Indexed keywords

ANISOTROPY; COBALT; CRYSTAL MICROSTRUCTURE; INTERFACES (MATERIALS); PLATINUM METALS; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

INTERFACIAL MICROSTRUCTURE; SURFACE ANISOTROPY;

MULTILAYERS;

EID: 0031152732     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00049-7     Document Type: Article

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