Morphology and in situ deformation of polyamide films investigated with scanning force microscopy

Surface and Interface Analysis

Volumn 25, Issue 7-8, 1997, Pages 537-542

  Drechsler, D ^a   Karbach, A ^b   Fuchs, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b BAYER AG   (Germany)

Author keywords

Polyamide; Polymers; Scanning force microscopy; Tensile tester

Indexed keywords

AMORPHOUS FILMS; CRYSTALLINE MATERIALS; DEFORMATION; MORPHOLOGY; POLYAMIDES; SURFACE STRUCTURE; TENSILE TESTING;

FORCE MODULATION; PHASE IMAGING; SCANNING FORCE MICROSCOPY;

PLASTIC FILMS;

EID: 0031152386     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199706)25:7/8<537::aid-sia265>3.0.co;2-r     Document Type: Article

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