An empirical study of software faults preventable at a personal level in a very large software development environment

Bell Labs Technical Journal

Volumn 2, Issue 3, 1997, Pages 221-232

  Yu, Weider D ^a,b   Barshefsky, Alvin ^a   Huang, Steel T ^a  

^a NOKIA RESEARCH CENTER   (United States)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEMS PROGRAMMING; KNOWLEDGE BASED SYSTEMS; OPTIMIZATION;

SOFTWARE FAULT PREVENTION;

COMPUTER AIDED SOFTWARE ENGINEERING;

EID: 0031152357     PISSN: 10897089     EISSN: None     Source Type: Journal    
DOI: 10.1002/bltj.2076     Document Type: Article

References (5)

1. Capers Jones, Applied Software Measurement, McGraw-Hill, New York, 1991.
2. American National Standards Institute/The Institute of Electrical and Electronics Engineering, Inc., Standard for Developing Software Life Cycle Processes, IEEE, New York, April 20, 1992.
3. Richard E. Fairley, Software Engineering Concepts, McGraw-Hill, New York, 1985.
4. Weider D. Yu, D. Paul Smith, and Steel T. Huang, Software Productivity Measurements, AT&T Technical Journal, Vol. 69, No. 3, May/June 1990, pp. 110-120.
5. Weider D. Yu, "Verifying Software Requirements: A Requirement Tracing Methodology and Its Software Tool," IEEE Communications Journal on Selected Areas in Communications, Vol. 12, No. 2, February 1994, pp.234-240.