The roles of residual stress and surface topography on hardness of Ti implanted Ti-6A1-4V

Materials Science and Engineering: A

Volumn 229, Issue 1-2, 1997, Pages 147-155

  Eberhardt, A W ^a   Pandey, R ^b   Williams, J M ^c   Weimer, J J ^d   Ila, D ^e   Zimmerman, R L ^e  

^a University of Alabama at Birmingham   (United States)

^b and Radiation Oncology   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF ALABAMA IN HUNTSVILLE   (United States)

^e ALABAMA A AND M UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Ion implantation; Nanohardness; Residual stress; Sputtering; Ti 6A1 4V

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUCKLING; HARDNESS; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; RESIDUAL STRESSES; SPUTTERING; SURFACE STRUCTURE;

NANOHARDNESS; SURFACE TEXTURING; SURFACE TOPOGRAPHY; TITANIUM ALUMINUM VANADIUM ALLOYS;

TITANIUM ALLOYS;

EID: 0031152305     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(97)00004-x     Document Type: Article

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