Electrical properties of end-group functionalised self-assembled monolayers

Microelectronic Engineering

Volumn 36, Issue 1-4, 1997, Pages 119-122

  Collet, J ^a   Bonnier, M ^b   Bouloussa, O ^b   Rondelez, F ^b   Vuillaume, D ^a  

^a INSTITUT D ELECTRONIQUE   (France)

^b INSTITUT CURIE   (France)

Author keywords

Conductivity; End group functionalisation; MIS; Organic monolayers; SAM

Indexed keywords

DEPOSITION; ELECTRIC CONDUCTIVITY; GRAFTING (CHEMICAL); MIS DEVICES; MONOLAYERS; PHOTOCONDUCTIVITY; SEMICONDUCTING SILICON; SUBSTRATES; CAPACITANCE MEASUREMENT; ELECTRIC CONDUCTIVITY MEASUREMENT; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MOLECULES; ORGANIC CONDUCTORS; OXIDES;

END GROUP FUNCTIONALIZATION; ORGANIC MONOLAYERS; PHOTOCONDUCTIVITY MEASUREMENT; SELF ASSEMBLED MONOLAYERS (SAM);

DIELECTRIC FILMS; MISFET DEVICES;

EID: 0031150240     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(97)00029-4     Document Type: Article

References (6)

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