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Volumn 206, Issue 1-2, 1997, Pages 8-14

High resolution transmission electron microscopy observation of the MoS2-Au interface formed due to stick-slip of MoS2 sliding on Au in relation to the friction trace

Author keywords

HRTEM; MoS2 Au; Stacking fault; Stick slip

Indexed keywords

CRYSTAL STRUCTURE; DIAMONDS; DISLOCATIONS (CRYSTALS); FRICTION; GOLD; INTERFACES (MATERIALS); SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; WEAR OF MATERIALS;

EID: 0031148427     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(96)07246-8     Document Type: Article
Times cited : (8)

References (10)
  • 1
  • 5
    • 0016023854 scopus 로고
    • N. Takahashi and K. Okada, Wear 28 (1974) 285; S. Fujiwara, Y. Sugawara, S. Morita, Microbeam Analysis 2 (1993) 3118; ibid. Nanotechnology 4 (1993) 311; S. Fujiwara, Y. Sugawara, S. Morita, M. Suzuki, T. Enomoto, Japanese Journal of Applied Physics 32 (6B) (1993) 2980.
    • (1974) Wear , vol.28 , pp. 285
    • Takahashi, N.1    Okada, K.2
  • 6
    • 0016023854 scopus 로고
    • N. Takahashi and K. Okada, Wear 28 (1974) 285; S. Fujiwara, Y. Sugawara, S. Morita, Microbeam Analysis 2 (1993) 3118; ibid. Nanotechnology 4 (1993) 311; S. Fujiwara, Y. Sugawara, S. Morita, M. Suzuki, T. Enomoto, Japanese Journal of Applied Physics 32 (6B) (1993) 2980.
    • (1993) Microbeam Analysis , vol.2 , pp. 3118
    • Fujiwara, S.1    Sugawara, Y.2    Morita, S.3
  • 7
    • 0016023854 scopus 로고
    • N. Takahashi and K. Okada, Wear 28 (1974) 285; S. Fujiwara, Y. Sugawara, S. Morita, Microbeam Analysis 2 (1993) 3118; ibid. Nanotechnology 4 (1993) 311; S. Fujiwara, Y. Sugawara, S. Morita, M. Suzuki, T. Enomoto, Japanese Journal of Applied Physics 32 (6B) (1993) 2980.
    • (1993) Nanotechnology , vol.4 , pp. 311


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.