Reliability measures for two-unit systems with a dependent structure for failure and repair times

Microelectronics Reliability

Volumn 37, Issue 5, 1997, Pages 829-833

  Rajamanickam, S Paul ^a   Chandrasekar, B ^a  

^a LOYOLA COLLEGE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AVAILABILITY; FAILURE (MECHANICAL); MATHEMATICAL MODELS; PROBABILITY; RANDOM PROCESSES; REPAIR;

PARALLEL SYSTEM OF ORDER; STANDBY SYSTEM OF ORDER; TRIVARIATE EXPONENTIAL DISTRIBUTION; TWO UNIT SYSTEMS;

RELIABILITY;

EID: 0031148148     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00115-1     Document Type: Article

References (14)

1. Gaver, D. P., Time to failure and availability of parallel system with repair. IEEE Trans. Reliab., 1963, 12, 30-38.
2. Gaver, D. P., Failure time for a redundant repairable system of two dissimilar elements. IEEE Trans. Reliab., 1964, 13, 14-22.
3. Harris, R., Reliability applications of a bivariate exponential distribution. Ops Res., 1968, 16, 18-27.
4. Kodama, M. and Deguchi, H., Reliability considerations for a two-unit redundant system with Erlang failure and repair distribution. IEEE Trans. Reliab., 1974, 23, 75-81.
5. Linton, J. G., Some advancements in the analysis of a two-unit parallel system. Microelectron. Reliab., 1976, 16, 39-46.
6. Subramanian, R. and Ravichandran, N., Probabilistic analysis of a two-unit parallel redundant system. Microelectron. Reliab., 1979, 19, 321-323.
7. Ravichandran, N., Analysis of a two-unit parallel system with phase type failure general repair. Microelectron. Reliab., 1981, 21(4), 567-572.
8. Osaki, S., A two-unit parallel redundant system with bivariate exponential life times. Microelectron. Reliab., 1980, 20, 521-523.
9. Pijnenburg, M., Ravichandran, N. and Regterschof, G., Stochastic analysis of a dependent parallel system. European J. Op Res., 1993, 68, 90-104.
10. Rau, J. G., Optimization and Probability in Systems Engineering. Van Nostrand Reinhold, New York, 1970.
11. Goel, L. R. and Shrivastava, P., Profit analysis of a two-unit redundant system with provision for rest and correlated failures and repairs. Microelectron. Reliab., 1991, 31, 827-833.
12. Goel, L. R., Tyagi, P. K. and Gupta, R., Analysis of a standby system with dependent repair time and slow switching device. Microelectron. Reliab., 1994, 34, 383-386.
13. Goel, L. R., Tyagi, P. K. and Gupta, R., Analysis of a two-unit standby system with preparation time and correlated failure and repairs. Microelectron. Reliab., 1995, 35, 1163-1165.
14. Marshall, A. W. and Olkin, I., A mutivariate exponential distribution. J. Amer. Statist. Assoc., 1967, 62, 30-44.