Analysis of a two unit deteriorating standby system with repair

Microelectronics Reliability

Volumn 37, Issue 5, 1997, Pages 857-861

  Jacob, Mendus ^a   Narmada, S ^a   Varghese, Thomas ^a  

^a MAHATMA GANDHI UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AVAILABILITY; ERRORS; FAILURE (MECHANICAL); GRAPH THEORY; INTEGRAL EQUATIONS; LAPLACE TRANSFORMS; PERSONNEL; PROBABILITY; REPAIR;

CRITICAL HUMAN ERROR; TWO UNIT DETERIORATING STANDBY SYSTEM;

RELIABILITY;

EID: 0031147920     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00112-6     Document Type: Article

References (3)

1. Dhillon, B. S. and Yang, N., Stochastic analysis of standby systems with common-cause failures and human errors. Microelectron. Reliab., 1992, 32(12), 1699-1712.
2. Gupta, P. P. and Kumar, A., Stochastic behaviour of a two-unit cold standby redundant electronic equipment under human failure. Microelectron. Reliab., 1987, 27(1), 15-18.
3. Pandey, D. and Mendus, J., Cost analysis, availability and MTTF of a three state standby complex system under common-cause and human failures. Microelectron. Reliab., 1995, 35(1), 91-95.