Short-wavelength phase-change optical data storage in In-Sb-Te alloy films

Materials Science and Engineering B

Volumn 47, Issue 1, 1997, Pages 18-22

  Men, Liqiu ^a   Jiang, Fusong ^a   Gan, Fuxi ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Differential scanning calorimetry; Optical data storage; Phase change materials; Short wavelength; X ray diffraction

Indexed keywords

ACTIVATION ENERGY; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; GAS LASERS; LASER BEAM EFFECTS; MAGNETRON SPUTTERING; OPTICAL DATA STORAGE; OPTICAL RECORDING; PHYSICAL PROPERTIES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ARGON LASER; INDIUM ANTIMONY TELLURIDE; PHASE-CHANGE MATERIALS; SHORT-WAVELENGTH RECORDING;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0031147259     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(97)02042-4     Document Type: Article

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