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Volumn 32, Issue 10, 1997, Pages 2605-2609

X-ray characterization of annealed Cu/Ni multilayers

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CALCULATIONS; CHARACTERIZATION; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); MATHEMATICAL MODELS; X RAY DIFFRACTION;

COPPER NICKEL MULTILAYER; INTERFACIAL FLUCTUATION; INTERPLANAR SPACING; X RAY DIFFRACTION INTENSITY;

MULTILAYERS;

EID: 0031147247 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/A:1018606618689 Document Type: Article

Times cited : (6)

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